Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Carrier frequency interferometry for wavefront measurements of coated optics

Not Accessible

Your library or personal account may give you access

Abstract

We apply carrier frequency interferometry to determine the wavefron deformation of thin films and multilayer dielectric coatings on thick substrates. The method allows to obtain the radius of curvature of the coated samples with high accuracy with a relatively simple setup.

© 2017 Optical Society of America

PDF Article
More Like This
Analysis of surface deformation by carrier frequency interferometry

E. Jankovska, S. Drobczynski, and C.S. Menoni
ThB.8 Optical Interference Coatings (OIC) 2016

Absolute distance measurement using synthetic wavelength interferometry of optical frequency combs

Guanhao Wu and Lei Liao
STh4L.7 CLEO: Science and Innovations (CLEO:S&I) 2017

Interferometric Measurement of Mid-Spatial Frequency Wavefront Errors

Robert Smythe and Dave Aikens
OM3B.1 Optical Fabrication and Testing (OF&T) 2017

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved