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Conferences > CLEO_QELS > 2016 > FTh3A > FTh3A.6

Nonlinear microscopy of nano-objects using excitation beam profiles with engineered phase jumps

L. Turquet, J.-P. Kakko, L. Karvonen, H. Jiang, T. J. Isotalo, T. Huhtio, T. Niemi, E. Kauppinen, H. Lipsanen, M. Kauranen, and G. Bautista

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Abstract

We introduce nonlinear microscopy with phase-engineered incident beams. By controlling the phase across an incident Hermite-Gaussian HG10 beam, we vary the longitudinal electric field component at focus, allowing tailoring of second-harmonic generation from vertically-oriented nanowires.

© 2016 Optical Society of America

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