Abstract
Plasmonic defect spectroscopy of STT-RAMs under high energy radiation is proposed here. We show that engineered constellation designs of the STT-RAMs can be used to understand radiation defects by measuring optical reflectivity, diffraction, or absorption.
© 2016 Optical Society of America
PDF ArticleMore Like This
Parinaz Sadri-Moshkenani, Mohammad Wahiduzzaman Khan, Md Shafiqul Islam, Dan Shi, Eric Montoya, Ilya Krivorotov, Nader Bagherzadeh, and Ozdal Boyraz
JTu3A.69 CLEO: Applications and Technology (CLEO:A&T) 2021
Parinaz Sadri-Moshkenani, Mohammad Wahiduzzaman Khan, Md Shafiqul Islam, Ilya Krivorotov, Mikael Nilsson, Nader Bagherzadeh, and Ozdal Boyraz
JW2A.60 CLEO: Applications and Technology (CLEO:A&T) 2019
S. Pitris, C. Vagionas, G. T. Kanellos, R. Kisacik, T. Tekin, R. Broeke, and N. Pleros
Tu2K.7 Optical Fiber Communication Conference (OFC) 2016