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Conferences > CLEO_QELS > 2015 > FW3D > FW3D.7

Beam Deflection Measurements of Nondegenerate Nonlinear Refractive Indices in Direct-gap Semiconductors

Peng Zhao, Matthew Reichert, Trenton R. Ensley, David J. Hagan, and Eric W. Van Stryland

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Abstract

We use the beam-deflection method to measure nondegenerate nonlinear refractive indices of ZnO and ZnSe and show, in agreement with theory, extremely nondegenerate nonlinear refraction is significantly larger than in the degenerate or near-degenerate case.

© 2015 Optical Society of America

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