Abstract
The combination of the AFM technique and the sphere-mediated microscopy (SMM) [1] opens a new opportunity to the Atomic Force Microscopy (AFM). With the help of a tipless AFM cantilever is possible to place and scan a microspheres (MS) close to the surface. From the optical point of view, when a MS is close to a surface act as high NA nanolenses whose optical characteristics define the maximum attainable resolution.
© 2017 IEEE
PDF ArticleMore Like This
Dustin Kleckner and Dirk Bouwmeester
QWG5 Quantum Electronics and Laser Science Conference (CLEO:FS) 2006
Arash Darafsheh, Consuelo Guardiola, Jarod C. Finlay, and Alejandro Cárabe
NM2C.5 Novel Techniques in Microscopy (NTM) 2015
Max Shtein, Brendan O’Connor, Yiying Zhao, and Kevin P. Pipe
CMKK1 Conference on Lasers and Electro-Optics (CLEO:S&I) 2008