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  • 2017 European Conference on Lasers and Electro-Optics and European Quantum Electronics Conference
  • (Optica Publishing Group, 2017),
  • paper JSII_1_3

Microsphere Embedded in Cantilever Opens the AFM to High Resolution Optical Microscopy

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Abstract

The combination of the AFM technique and the sphere-mediated microscopy (SMM) [1] opens a new opportunity to the Atomic Force Microscopy (AFM). With the help of a tipless AFM cantilever is possible to place and scan a microspheres (MS) close to the surface. From the optical point of view, when a MS is close to a surface act as high NA nanolenses whose optical characteristics define the maximum attainable resolution.

© 2017 IEEE

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