Abstract

High power laser systems suffer from optical materials overheating by laser radiation. For optical absorptance testing laser calorimetry is widely used [1]. Its main part is temperature kinetics measurement of the sample exposed to laser radiation. Temperature is measured mostly by indirect methods with sensors adjusted to the sample surface. However, absorption of scattered radiation can induce additional heating of the sensor. It was shown that piezoelectric resonance impedance spectroscopy (PRIS) can be applied for precise noncontact temperature measurement of nonlinear optical crystals [2]. Nevertheless this method is inappropriate for examination of nonpiezoelectric materials.

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