Abstract

Silica microwires have been used in various applications where its diameter is a critical parameter. Examples are coupling light into silicon cavities, supercontinuum generation and evanescent filed sensors. Diameter measurement is usually performed using scanning electron microscopy, which is a destructive method and difficult to perform in various locations along the wire length. In this paper, we use forward Brillouin scattering (FBS) to precisely measure the diameter of silica wires in sub-micron range, as well as gain insight into its uniformity along the length. The FBS technique is completely non-destructive.

© 2015 IEEE