Abstract

Nowadays, the carrier-envelope phase (CEP) stability of high peak power few-cycle laser pulses is one of the most common requirements, as it may ultimately affect the accuracy of phase-related experiments in high harmonic and attosecond pulse generation, coherent beam combination, and precise frequency metrology [1]. Several experimental studies highlight the role of the mechanical stability of the elements in a chirped pulse amplification (CPA) system, especially the stretcher-compressor stages [2,3]. Here we present a systematic experimental and numerical study on the CEP drift and noise originated exclusively from a Ti:Sapphire amplifier stage.

© 2015 IEEE

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