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  • 2015 European Conference on Lasers and Electro-Optics - European Quantum Electronics Conference
  • (Optica Publishing Group, 2015),
  • paper CD_5a_1

Nonlinear Figure-of-merit Measurement of Waveguides Using a Top-hat Dispersive-scan Technique

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Abstract

The Z-scan is a well-developed technique to measure intensity-dependent refractive index and absorption of materials, but it cannot be applied to waveguides. Keeping the advantage of a single beam measurement method, one can transpose the Z-scan in the temporal domain by measuring the spectral linewidth and the power of transmitted pulses for various 2nd order dispersion coefficients ϕ(2) applied to the injected pulses [1]. Although this so-called dispersion-scan (D-scan) method has been employed in silica based optical fibres [1,2], we report hereafter the first complete nonlinear characterisation of a waveguide exhibiting both optical Kerr effect and two-photon absorption (TPA), enabling the measurement of the TPA figure-of-merit FOMTPA = n2/(λ β2), with n2 the nonlinear refractive index and β2 the TPA coefficient of the waveguide. Addressing the issue of the sensitivity, we also report the first top-hat D-scan technique, analogue to the spatial top-hat Z-scan [3,4].

© 2015 IEEE

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