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  • 2013 Conference on Lasers and Electro-Optics - International Quantum Electronics Conference
  • (Optica Publishing Group, 2013),
  • paper CL_5_2

Quantitative phase noise in two color low coherence Digital Holographic Microscope

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Abstract

Short coherence digital holographic microscopy eliminates the problem of parasitic interferences resulting from long coherence length, but reduces the field of view in off-axis DHM [1]. The reason is that slight angle between reference and object beams, restricts the overlap area of two beams on the camera. We have recently introduced [2], a method based on a volume diffractive element (VDOE) to correct the coherence plane tilt in off-axis DHM. The VDOE consists of two phase gratings recorded on a photopolymer (BAYFOL® HX) from Bayer MaterialScience AG, each laminated on one side of a wedge prism. The VDOE is placed in the reference arm of an off-axis DHM to introduce a small tilt γ in the coherence plane of the reference without any effect on the propagation direction. An image of the device is shown in Fig. 1.

© 2013 IEEE

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