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  • CLEO/Europe and EQEC 2011 Conference Digest
  • OSA Technical Digest (CD) (Optica Publishing Group, 2011),
  • paper CD3_5

High Index Glass CMOS Compatible All-optical Chips for Telecom and Optical Interconnects

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Abstract

All-optical signal processing has been demonstrated extensively in Si including demultiplexing at 160Gb/s via four-wave mixing (FWM) [1] and optical regeneration [2], as well as in chalcogenide glass (ChG) waveguides[3]. The efficiency of all-optical devices can be improved by increasing the nonlinear parameter, γ = ω n2 / c Aeff (Aeff is the waveguide effective area, n2 is the Kerr nonlinearity) as well as by using resonant structures to enhance the local field intensity. Semiconductors and ChG offer excellent optical confinement and a high n2 that has produced γ’s of 200,000 W−1 km−1 for Si nanowires [2], and 93,400 W−1 km−1 in ChG nanotapers [4]. Yet silicon suffers from a poor intrinsic nonlinear figure of merit (FOM = n2 / (βλ), where β is the two-photon absorption coefficient) due to two-photon absorption (TPA) and the resulting free carriers [5]. Here, we report a wide range of functions in a CMOS compatible high index doped silica glass platform, including an integrated multiple wavelength source [6,7], an ultra-high repetition rate modelocked laser [8], and an all-optical integrator[9]. We achieve CW oscillation in a Q=1.2 million micro-ring resonator with a slope efficiency of 7.4% (single oscillating mode, single port), a threshold power of 54mW, and frequency spacings from 200GHz to > 6THz. We also achieve modelocking with repetition rates as high as 800GHz [9]. We also report novel functions in ultra-long (45cm) spiral waveguides, including a time-lens optical oscilloscope and parametric amplifier with > 15dB of gain [10]. The success of these devices is due to very low linear loss, negligible nonlinear loss (up to 25GW/cm2), and a high γ ≅ 233W−1km−1. The low loss, design flexibility, and CMOS compatibility of this platform will enable devices for telecommunications, computing, sensing, metrology and other areas.

© 2011 Optical Society of America

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