X-Ray Diffraction Measurements of a Femtosecond-Laser Written Waveguides in an YAG Single Crystal

O. Henneberg; R. Menzel; R. Elsner; D. Korn; J. Siebenmorgen; G. Huber

CLEO/Europe and EQEC 2009 Conference Digest
(Optica Publishing Group, 2009),
paper CM_P2

X-Ray Diffraction Measurements of a Femtosecond-Laser Written Waveguides in an YAG Single Crystal

O. Henneberg, R. Menzel, R. Elsner, D. Korn, J. Siebenmorgen, and G. Huber

The European Conference on Lasers and Electro-Optics 2009

Munich Germany
14–19 June 2009
ISBN: 978-1-4244-4080-1

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O. Henneberg, R. Menzel, R. Elsner, D. Korn, J. Siebenmorgen, and G. Huber, "X-Ray Diffraction Measurements of a Femtosecond-Laser Written Waveguides in an YAG Single Crystal," in CLEO/Europe and EQEC 2009 Conference Digest, (Optica Publishing Group, 2009), paper CM_P2.

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Abstract

Miniaturization of optical components is one major task for the further development of high tech equipment. Perfect single crystals or glasses can be structured with femtosecond-lasers. Thus e.g. waveguides can be created and used as laser resonator [1-3]. In order to improve performance it is necessary to obtain detailed information about the local physical properties in the patterned area and its surrounding. While the bulk properties of a crystal are well known it is very difficult to obtain information about basic physical quantities like crystal structure, density and refractive index in the patterned area.

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