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  • CLEO/Europe and IQEC 2007 Conference Digest
  • (Optica Publishing Group, 2007),
  • paper CG2_2

Sub-20 fs time resolved EXAFS at the Si K edge

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Abstract

Following the ultrafast motion of atoms is one of the most challenging problems in physics. Techniques such as X-ray diffraction or X-ray absorption spectroscopy (XAS) allow obtaining information about the structure in a direct way. From the modulation in the absorption spectrum it is possible to estimate the atomic distance as described in the frame of extended x-ray absorption fine structure spectroscopy (EXAFS). By combining EXAFS with methods of conventional pump-probe spectroscopy it is possible to follow atomic motion such as structural modification after the excitation with an intense laser pulse. The structural modification triggered with an ultrafast laser pulses can be probed by recording the x-ray absorption spectra above the K or L edge using ultrashort x-ray pulses.

© 2007 IEEE

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