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Optica Publishing Group
  • CLEO/Europe and IQEC 2007 Conference Digest
  • (Optica Publishing Group, 2007),
  • paper CE_14

Free carrier lifetime measurements in SiGe/Si planar waveguides

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Abstract

Minority carrier lifetime in Si/SiGe/Si planar waveguides has been estimated measuring the free carrier absorption transient of an infrared probe beam. Electron-hole pair excitation is induced by a pulsed 810nm femtosecond laser beam.

© 2007 IEEE

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