Abstract
The field of Nonlinear Optics has provided many techniques to characterize photonic materials, yielding direct infonnation on the nonlinearities and its origin. One well established method is known as Z-scan and one of its improvements is the so-called eclipse Z-scan [1], In this paper, we introduce a new combination of the eclipse Z-scan with the recently introduced thermally managed Z-scan [2], that gains in sensitivity associated with the simultaneous measurement of the thermal and nonthennal contributions to the nonlinear (NL) refractive properties of photonic materials using relatively low laser intensities. To demonstrate the method, we measured both the thermal and nonthennal nonlinearities of liquid CS2, bulk Si02 and water, whose results agree with the literature. We also explored the large sensitivity of the technique by measuring the NL response of a water solution of Tryptophan which presents small NL refractive index and has important biological action. Figure 1 shows the modified eclipse Z-scan setup.
© 2007 IEEE
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