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Widely Tunable, Fast Scanning, Narrow Linewidth, Mid-IR Source Centred at 2.9 Um

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Abstract

A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 Um in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.

© 2020 The Author(s)

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