Design and fundamental limits of nearfield magnetic-force scanning microscopy via the no-cloning theorem

Jonathan Nemirovsky; Chen Mechel; Eliahu Cohen; Ido Kaminer

doi:10.1364/CLEO_AT.2020.AF3K.6

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 2020),
paper AF3K.6
•https://doi.org/10.1364/CLEO_AT.2020.AF3K.6

Design and fundamental limits of nearfield magnetic-force scanning microscopy via the no-cloning theorem

Jonathan Nemirovsky, Chen Mechel, Eliahu Cohen, and Ido Kaminer

CLEO: Applications and Technology 2020

Washington, DC United States
10–15 May 2020
ISBN: 978-1-943580-76-7

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Quantum Sensing and Enabling Instrumentation (AF3K)

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J. Nemirovsky, C. Mechel, E. Cohen, and I. Kaminer, "Design and fundamental limits of nearfield magnetic-force scanning microscopy via the no-cloning theorem," in Conference on Lasers and Electro-Optics, OSA Technical Digest (Optica Publishing Group, 2020), paper AF3K.6.

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Abstract

We analyze nearfield measurements of magnetic fields originating from quantum sources and measured by quantum probes. We show that cloning-inspired techniques reveal optimal measurement schemes and new universal precision bounds for nearfield detectors.

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