Ultrahigh Spatial Resolution of Mid-Infrared Optical Excitations with Monochromated Electron Energy-Loss Spectroscopy

Jordan A. Hachtel; Andrea Konečná; Kevin M. Roccapriore; Shin Hum Cho; Delia J. Milliron; F. Javier Garcia de Abajo; F. Javier Garcia de Abajo; Juan Carlos Idrobo

doi:10.1364/CLEO_AT.2020.AF1K.7

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 2020),
paper AF1K.7
•https://doi.org/10.1364/CLEO_AT.2020.AF1K.7

Ultrahigh Spatial Resolution of Mid-Infrared Optical Excitations with Monochromated Electron Energy-Loss Spectroscopy

Jordan A. Hachtel, Andrea Konečná, Kevin M. Roccapriore, Shin Hum Cho, Delia J. Milliron, F. Javier Garcia de Abajo, and Juan Carlos Idrobo

CLEO: Applications and Technology 2020

Washington, DC United States
10–15 May 2020
ISBN: 978-1-943580-76-7

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Spectral and Power Detection and Control (AF1K)

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J. A. Hachtel, A. Konečná, K. M. Roccapriore, S. H. Cho, D. J. Milliron, F. J. G. de Abajo, and J. C. Idrobo, "Ultrahigh Spatial Resolution of Mid-Infrared Optical Excitations with Monochromated Electron Energy-Loss Spectroscopy," in Conference on Lasers and Electro-Optics, OSA Technical Digest (Optica Publishing Group, 2020), paper AF1K.7.

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Abstract

Monochromated electron energy-loss spectroscopy (EELS) can now reach the mid-infrared spectral regime in the electron microscope. Here, we use monochromated EELS to examine geometry and coupling effects for infrared excitations in complex nanostructures.

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