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Conferences > CLEO_AT > 2019 > ATh4K > ATh4K.4

Diode Laser-based Film Thickness Measurement of DEF in a generic exhaust gas test bench for the investigation of SCR-relevant processes

Anna Schmidt, Benjamin Kühnreich, Matthias Jacobs, and Steven Wagner

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Abstract

An absorption based laser sensor for film thickness measurement of DEF in an exhaust gas test bench is presented. A wavelength pre-selection ensures that film-thicknesses could be measured without cross sensitivity to temperature or concentration.

© 2019 The Author(s)

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