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Conferences > CLEO_AT > 2019 > ATh4K > ATh4K.1

A Breakthrough Industrial THz Application: Robust In-situ THz-based Paint Layer Monitoring

D.J.H.C. Maas, A. Frank, and J.L.M van Mechelen

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Abstract

We present a THz paint analyzer for measuring wet and dry paint multilayers insensitive to surface curvatures and vibrations. The layers can be measured simultaneously with an average error smaller than 1.1 µm.

© 2019 The Author(s)

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