Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Scattering Loss in Thin, Shallow-Ridge Silion-on-Insulator Waveguides

Not Accessible

Your library or personal account may give you access

Abstract

Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.

© 2012 Optical Society of America

PDF Article
More Like This
Transition from “Magic Width” to “Anti-Magic Width” in Thin-ridge Silicon-on-Insulator Waveguides

Naser Dalvand, Thach G. Nguyen, Ravi S. Tummidi, Thomas L. Koch, and Arnan Mitchell
CM4M.7 CLEO: Science and Innovations (CLEO:S&I) 2012

Low-loss ridge waveguides in thin film lithium niobate-on-insulator (LNOI) fabricated by reactive ion etching

Mohammad Amin Baghban, Sunil Kumar Mahato, and Katia Gallo
ITu1A.2 Integrated Photonics Research, Silicon and Nanophotonics (IPR) 2016

Low Loss Silicon Nanowire Waveguide Fabricated with 0.13μm CMOS Technology

Zhen Sheng, Chao Qiu, Hao Li, Le Li, Albert Pang, Aimin Wu, Xi Wang, Shichang Zou, and Fuwan Gan
ATh1B.2 Asia Communications and Photonics Conference (ACP) 2012

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved