Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Time resolved X-ray studies in semiconductor nanostructures

Not Accessible

Your library or personal account may give you access

Abstract

Time resolved X-ray diffraction has been used to study acoustic oscillations in InAs/Sb nanowires with diameters of 80 nm and 40 nm in order to determine the speed of sound in the wires.

© 2012 Optical Society of America

PDF Article
More Like This
Time-resolved x-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si-heterostructures

K. Sokolowski Tinten, M. Horn von Hoegen, D. von der Linde, A. Cavalleri, C. W. Siders, F. L. H. Brown, C. Toth, J. A. Squier, C. P. J. Barty, K. R. Wilson, and M. Kammler
MF43 International Conference on Ultrafast Phenomena (UP) 2000

Time-resolved x-ray diffraction of high-wavevector acoustic phonons

Yuan Gao and Matthew F. DeCamp
LTu4H.3 Laser Science (LS) 2012

Time resolved X-ray diffraction at kHz repetition rate

P. Zhou, S. Kähle, U. Shymanovich, M. Nicoul, K. Sokolowski-Tinten, and D. von der Linde
QMH5 Quantum Electronics and Laser Science Conference (CLEO:FS) 2006

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved