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Transient measurement of Laser wakefield at the SILEX-I: Ti: Sapphire Laser

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Abstract

Based on single-shot spectral interferometry, transient measuring technology of laser wakefield at the SILEX-I: Ti: Sapphire Laser is developed. The wakefield is captured with ~140 fs resolution over a temporal region of 1 ps.

© 2012 Optical Society of America

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