Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Coherent Raman Microspectroscopy for Non-Contact and Non-Destructive Measurements of Carrier Concentrations in Wide-Bandgap Semiconductors

Not Accessible

Your library or personal account may give you access

Abstract

We developed a coherent Raman microspectroscopy that realizes a three-dimensional visualization of the spatial distribution of optical phonon modes in wide-bandgap semiconductors. This microspectroscopy will be a powerful tool for measuring the carrier concentration in semiconductors.

© 2018 The Author(s)

PDF Article
More Like This
Ultrafast carrier dynamics in wide bandgap semiconductor materials

Roderick B Davidson, Adam D. Dunkelberger, Ioannis Chatzakis, Brad B. Pate, Joshua D. Caldwell, and Jeffrey C. Owrutsky
JTu3A.47 Frontiers in Optics (FiO) 2017

Gas Concentration Measurements Based on Ultrabroadband Coherent Anti-Stokes Raman Scattering Using the Non-resonant Signal

Yang Ran, Stefan Nolte, Andreas Tünnermann, and Roland Ackermann
SW4H.2 CLEO: Science and Innovations (CLEO:S&I) 2020

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved