Abstract
We report the first third order nonlinear characterization of Ge-rich Si1−xGex waveguides, with Germanium concentrations ranging from 0.7 to 0.9. A bidirectional top hat D-Scan method was used to determine the waveguide nonlinear parameters and to deduce the Kerr nonlinear refractive index and the two-photon absorption coefficient at the wavelength of 1.58 μm.
© 2017 Optical Society of America
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