Test System of 100GHz Photodetector Time Response at NIM

A. Jianwei Li; B. Haiyong Gan; C. Nan Xu

2015 Conference on Lasers and Electro-Optics Pacific Rim
(Optica Publishing Group, 2015),
paper 25F1_3

Test System of 100GHz Photodetector Time Response at NIM

A. Jianwei Li, B. Haiyong Gan, and C. Nan Xu

Conference on Lasers and Electro-Optics/Pacific Rim 2015

Busan Republic of Korea
24–28 August 2015
ISBN: 978-1-4673-7110-0

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Optical Metrology and Sensing I (25F1)

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A. J. Li, B. H. Gan, and C. N. Xu, "Test System of 100GHz Photodetector Time Response at NIM," in 2015 Conference on Lasers and Electro-Optics Pacific Rim, (Optica Publishing Group, 2015), paper 25F1_3.

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Abstract

Electrooptic sampling has been shown to be a very powerful technique for making time-domain measurements of fast electronic devices and circuits. In this paper, we review the principles of electrooptic sampling technique for electronic waveform probing with applications to characterizing 100GHz photodetector pulse response.

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