THz Measurement of Refractive Index and Thickness of Ceramic Coating on a Metal Substrate

T. Fukuchi; N. Fuse; M. Mizuno; K. Fukunaga

2013 Conference on Lasers and Electro-Optics Pacific Rim
(Optica Publishing Group, 2013),
paper TuC2_3

THz Measurement of Refractive Index and Thickness of Ceramic Coating on a Metal Substrate

T. Fukuchi, N. Fuse, M. Mizuno, and K. Fukunaga

Conference on Lasers and Electro-Optics/Pacific Rim 2013

Kyoto Japan
30 June–4 July 2013
ISBN: 978-1-4673-6475-1

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Terahertz Imaging and Sensing (TuC2)

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T. Fukuchi, N. Fuse, M. Mizuno, and K. Fukunaga, "THz Measurement of Refractive Index and Thickness of Ceramic Coating on a Metal Substrate," in 2013 Conference on Lasers and Electro-Optics Pacific Rim, (Optica Publishing Group, 2013), paper TuC2_3.

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Abstract

A method to obtain the refractive index and thickness of ceramic coating on a metal substrate by terahertz reflection measurement is presented. The measurement results are compared with the results of microscopic observation.

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