Tip-enhanced Raman spectroscopic measurements in the sub-nanometric vicinity of a metallic tip

P. Verma; T. Ichimura; T. Yano; Y. Saito; S. Kawata

Conference on Lasers and Electro-Optics/Pacific Rim 2009
(Optica Publishing Group, 2009),
paper WD4_3

Tip-enhanced Raman spectroscopic measurements in the sub-nanometric vicinity of a metallic tip

P. Verma, T. Ichimura, T. Yano, Y. Saito, and S. Kawata

Conference on Lasers and Electro-Optics/Pacific Rim 2009

Shanghai China
30 August–3 September 2009
ISBN: 978-1-4244-3830-3

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Near-Field Optics (WD4)

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P. Verma, T. Ichimura, T. Yano, Y. Saito, and S. Kawata, "Tip-enhanced Raman spectroscopic measurements in the sub-nanometric vicinity of a metallic tip," in Conference on Lasers and Electro-Optics/Pacific Rim 2009, (Optica Publishing Group, 2009), paper WD4_3.

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Abstract

By developing a new time-gated technique, we demonstarte sub-nanometric control over the tip-sample distance in tip-enhanced Raman spectrscopy, which allows us to precisely control the chemical and mechanical effect and to realize super-high resolution imaging.

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