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Optica Publishing Group
  • Conference on Lasers and Electro-Optics/Pacific Rim 2007
  • (Optica Publishing Group, 2007),
  • paper ThP_012

Measurement of Birefringence in Nonlinear Crystals by Michelson Interferometer

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Abstract

We present a method to measure the index of refraction of a wafer-type material accurately by using a modified Michelson interferometer. With this method, the difference between the refractive index of the ordinary-wave and that of the extraordinary-wave in the representative nonlinear crystal, LiNbO3 could be measured with ease.

© 2007 IEEE

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