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  • Conference on Lasers and Electro-Optics/Pacific Rim 2007
  • (Optica Publishing Group, 2007),
  • paper FF1_2

Scattering-type Near-field Microscopy: From Nanoscale Infrared Material Recognition to Superlens Studies

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Abstract

We demonstrate that scattering-type near-field optical microscopy (s-SNOM) allows nanoscale resolved infrared mapping of materials and electron concentrations e.g. in cross-sectional samples of semiconductor nanostruetures. s-SNOM can be also applied to map the optical near fields of novel photonic structures as we show with a SiC superlens.

© 2007 IEEE

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