Frequency Noise of a Microchip Raman Laser

Tao Lu; Lan Yang; Tal Carmon; Bumki Min; Kerry Vahala

doi:10.1364/CLEO.2009.CTuB3

Conference on Lasers and Electro-Optics/International Quantum Electronics Conference
OSA Technical Digest (CD) (Optica Publishing Group, 2009),
paper CTuB3
•https://doi.org/10.1364/CLEO.2009.CTuB3

Frequency Noise of a Microchip Raman Laser

Tao Lu, Lan Yang, Tal Carmon, Bumki Min, and Kerry Vahala

Conference on Lasers and Electro-Optics 2009

Baltimore, Maryland United States
31 May–5 June 2009
ISBN: 978-1-55752-869-8

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Limitations and Noise in Optical Metrology (CTuB)

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T. Lu, L. Yang, T. Carmon, B. Min, and K. Vahala, "Frequency Noise of a Microchip Raman Laser," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference, OSA Technical Digest (CD) (Optica Publishing Group, 2009), paper CTuB3.

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Abstract

We report measurement of the fundamental component of frequency noise in a micro-Raman laser fabricated on a silicon chip. A frequency noise spectral component that is equivalent to a Schawlow-Townes linewidth of 3-Hz is measured.

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