Metrology with Cold Atoms

Mark Kasevich

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Conferences > CLEO > 2008 > CMC > CMC1

Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
OSA Technical Digest (CD) (Optica Publishing Group, 2008),
paper CMC1

Metrology with Cold Atoms

Mark Kasevich

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Mark Kasevich

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M Kasevich

Conference on Lasers and Electro-Optics 2008

San Jose, California United States
4–9 May 2008
ISBN: 978-1-55752-859-9

From the session
Precision Optical Metrology (CMC)

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M. Kasevich, "Metrology with Cold Atoms," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest (CD) (Optica Publishing Group, 2008), paper CMC1.

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Conference on Lasers and Electro-Optics 2008
San Jose, California United States
4–9 May 2008
ISBN: 978-1-55752-859-9
From the session Precision Optical Metrology (CMC)

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