Low Threshold VCSELs Recess-Integrated on Si-CMOS ICs

James M. Perkins; Clifton G. Fonstad

Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
OSA Technical Digest Series (CD) (Optica Publishing Group, 2007),
paper CTuGG4

Low Threshold VCSELs Recess-Integrated on Si-CMOS ICs

James M. Perkins and Clifton G. Fonstad

Conference on Lasers and Electro-Optics 2007

Baltimore, Maryland United States
6–11 May 2007
ISBN: 1557528349

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VCSELs and Integration (CTuGG)

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J. M. Perkins and C. G. Fonstad, "Low Threshold VCSELs Recess-Integrated on Si-CMOS ICs," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest Series (CD) (Optica Publishing Group, 2007), paper CTuGG4.

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Abstract

VCSELs have been integrated as individual pills within the dielectric stack of commercially produced Si ICs. 1 mA threshold currents and thermal characteristics similar to those of native substrate devices are seen.

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