Abstract
By controlling the voltage difference between the punch-through and breakdown voltages photon-counting APD leakage current and avalanche I-V characteristics can be improved. We fabricated different devices and demonstrated performance improvement at different temperatures.
© 2006 Optical Society of America
PDF ArticleMore Like This
Yoshito Miyamoto, Kenji Tsujino, Jun Kataoka, and Akihisa Tomita
P7.04 European Conference and Exhibition on Optical Communication (ECOC) 2012
A. W. Lightstone and R. J. McIntyre
NIT183 Photon Correlation Techniques and Applications (PCS) 1988
Henri Dautet, Pierre Deschamps, Andrew MacGregor, Robert McIntyre, and Claude Trottier
WA4 Photon Correlation and Scattering (PCS) 1992