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Conferences > CLEO > 2005 > CWI > CWI1
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2005),
  • paper CWI1

Determination of the Refractive Index Profile in VCSELs by Spatial-Spectral Mode Imaging

M. Salsbury and R. Gordon

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Abstract

We imaged the near-field intensity distribution of vertical-cavity surface-emitting lasers (VCSELs) to determine the spatial and spectral distribution of the modes. These mode distributions were used to calculate the refractive index distribution of broad-area VCSELs.

© 2005 Optical Society of America

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