Abstract
We present a system for the rapid characterization of nanoparticles for biosensors, providing concurrent atomic force microscopy and scattering spectra of individual nanoparticles and simultaneous spectra from various nanostructures created by electron beam lithography.
© 2005 Optical Society of America
PDF ArticleMore Like This
Perry Schein and David Erickson
JW4A.108 Frontiers in Optics (FiO) 2016
Andrea Steinbrück, Andrea Csáki, Grit Festag, Thomas Schüler, and Wolfgang Fritzsche
6633_90 European Conference on Biomedical Optics (ECBO) 2007
Abhay Kotnala, Yi Zheng, Jianping Fu, and Wei Cheng
OtW3E.3 Optical Trapping Applications (OMA) 2017