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  • Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2004),
  • paper CThT23

Single shot temporal characterization of sub-hundred femtosecond electron bunches at the SLAC SPPS experiment

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Abstract

Electro-optic sampling (EOS) is used to temporally characterize compressed ultra-relativistic electron bunches at the Stanford Linear Accelerator Center (SLAC). These electron bunches are used to produce ultrafast x-rays at the Sub-Picosecond Pulse Source experiment (SPPS).

© 2004 Optical Society of America

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