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  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference
  • Technical Digest (Optica Publishing Group, 2003),
  • paper CWI3

Ultra-High Resolution Index of Refraction Profiles of Femtosecond Laser Modified Silica Structures

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Abstract

Ultra-high spatial resolution index of refraction profiles of femtosecond laser modified structures in silica glass have been measured using the combination of chemical etching and atomic force microscopy.

© 2003 Optical Society of America

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