Extremely simple device for measurement of 20-fs pulses

Mark Kimmel; Patrick O’Shea; Rick Trebino

Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference
Technical Digest (Optica Publishing Group, 2003),
paper CWE4

Extremely simple device for measurement of 20-fs pulses

Mark Kimmel, Patrick O’Shea, and Rick Trebino

Conference on Lasers and Electro-Optics 2003

Baltimore, Maryland United States
1–6 June 2003
ISBN: 1-55752-733-4

From the session
Pulse Characterization (CWE)

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M. Kimmel, P. O’Shea, and R. Trebino, "Extremely simple device for measurement of 20-fs pulses," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference, Technical Digest (Optica Publishing Group, 2003), paper CWE4.

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Abstract

By using a tight focus and appropriate imaging optics, we have designed a GRENOUILLE with a phasematching range of over 100-nm. Additionally, we employ an almost all-reflective geometry to minimize the amount of dispersion, allowing accurate measurement of pulses as short as 20 fs.

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