We present a new and simple technique for measuring simultaneously the amplitude and phase transfer functions of semiconductor devices. These data allow us to calculate the linewidth enhancement factor, , and first results are shown.
© 2003 Optical Society of America
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
Login to access OSA Member Subscription