Acoustic Phonon Dispersion Measured with Time-Resolved X-ray Diffraction

M.F. DeCamp; D.A. Reis; P.H. Bucksbaum; B. Adams; E.M. Dufresne; R. Clarke

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 2002),
paper JTuD2

Acoustic Phonon Dispersion Measured with Time-Resolved X-ray Diffraction

M.F. DeCamp, D.A. Reis, P.H. Bucksbaum, B. Adams, E.M. Dufresne, and R. Clarke

Conference on Lasers and Electro-Optics 2002

Long Beach, California United States
19–22 May 2002
ISBN: 1-55752-706-7

From the session
Ultrafast X-ray Diffraction (JTuD)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
M. F. DeCamp, D. A. Reis, P. H. Bucksbaum, B. Adams, E. M. Dufresne, and R. Clarke, "Acoustic Phonon Dispersion Measured with Time-Resolved X-ray Diffraction," in Conference on Lasers and Electro-Optics, M. Fejer, F. Leonberger, J. Fujimoto, and S. Newton, eds., OSA Technical Digest (Optica Publishing Group, 2002), paper JTuD2.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Save article

Abstract

Recent experiments have studied propagation effects of ultrafast acoustic pulses using optical pump-probe techniques.^1,2 These experiments observed the dispersion of high frequency acoustic pulses. The dispersion relation governing acoustic pulse propagation includes higher order terms with the generation of high frequency acoustic phonons (ω(k) = ck – γk³).

PDF Article

More Like This

Time-resolved x-ray diffraction of high-wavevector acoustic phonons

Yuan Gao and Matthew F. DeCamp
LTu4H.3 Laser Science (LS) 2012

Time-resolved x-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si-heterostructures

K. Sokolowski Tinten, M. Horn von Hoegen, D. von der Linde, A. Cavalleri, C. W. Siders, F. L. H. Brown, C. Toth, J. A. Squier, C. P. J. Barty, K. R. Wilson, and M. Kammler
MF43 International Conference on Ultrafast Phenomena (UP) 2000

Ultrafast Acoustic Phonon Dynamics in the Weyl Semimetal TaAs Probed by Time-Resolved X-ray Diffraction

Min-Cheol Lee, N. Sirica, S. W. Teitelbaum, A. Maznev, G. A. de la Pena Munoz, V. Krapivin, Y. Huang, J. Shi, R. Tutchton, J.-X. Zhu, L. X. Zhao, G. F. Chen, B. Xu, R. Yang, X. G. Qiu, D. A. Yarotski, K. A. Nelson, M. Trigo, D. A. Reis, and R. P. Prasankumar
FTh3B.2 CLEO: QELS_Fundamental Science (CLEO:FS) 2020

Previous Article Next Article