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  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 2002),
  • paper CMG2

Ultrafast Time-Resolved Interferometry at Femtosecond Laser Excited Surfaces

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Abstract

Ultrashort pulsed laser ablation of absorbing solids exhibits unique, material-independent properties such as an extremely sharp threshold and ablation plumes with very steep fronts towards vacuum, leading to the observation of a characteristic transient interference phenomenon.1 To directly follow the expansion dynamics after femtosecond laser excitation we have developed an interferometric setup, which allows highly accurate measurements of transient surface deformations with a vertical sensitivity of < 1 nm, a temporal resolution of 100 fs, and a lateral spatial resolution of 1–2 μm.

© 2002 Optical Society of America

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