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Conferences > CLEO > 2001 > CTuM > CTuM56
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 2001),
  • paper CTuM56

A novel contrast mechanism of emissionmode near-field microscopy applied to diode laser structures

V. Malyarchuk, J.W. Tomm, T. Günther, and Ch. Lienau

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Abstract

Near-field Scanning Optical Microscopy (NSOM) is currently evolving into an important analytical tool for optoelectronic devices. Here, a powerful approach is to use the fiber tip of the NSOM as an excitation light source when the investigated device itself serves as a detector.

© 2001 Optical Society of America

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