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  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 2001),
  • paper CThL66

Extremely short external cavity semiconductor laser: profilometry via wavelength tuning

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Abstract

We are studying wavelength tuning profilometry based on direct optical feedback to a laser diode. In this system, the front facet of a semiconductor laser is brought close to the sample surface (for example the recorded surface of an optical disk) so that some of the light emitted by the laser is reflected back into the laser cavity (i.e. laser's front facet and the reflective sample surface form an external cavity).

© 2001 Optical Society of America

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