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Conferences > CLEO > 2000 > CFB > CFB1
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 2000),
  • paper CFB1

On-wafer 2D etectric-field-vector mapping using one-beam electro-optic probing technique

W.H. Chen, W.K. Kuo, S.L. Huang, Y.T. Huang, and H.Z. Cheng

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Abstract

Depending upon the space group of EO crystals and the applied electric-field vectors (E-vector), the index ellipsoid of EO crystal experiences compressed/stretched deformation or rotational deformation. Most conventional EO probing techniques only use compressed/ stretched deformation modulation (CSDM),1,2

© 2000 Optical Society of America

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