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Conferences > CLEO > 1999 > CMJ > CMJ6
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1999),
  • paper CMJ6

Characterization of thick scattering media via speckle measurements using a tunable coherence source

J.D. McKinney, M.A. Webster, K.J. Webb, and A.M. Weiner

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Abstract

Non-intrusive characterization of thick optically scattering media and detection of embedded inhomogeneities is of interest for various industrial and biomedical applications.

© 1999 Optical Society of America

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