Nonlinear optics to measure the frequency of iodine-stabilized Nd:YAG

Matthew Taubman; Bruce Tiemann; Long-Sheng Ma; Feng-Lei Hong; Olivier Pfister; Jun Ye; John L. Hall

Conference on Lasers and Electro-Optics
(Optica Publishing Group, 1998),
paper CThT4

Nonlinear optics to measure the frequency of iodine-stabilized Nd:YAG

Matthew Taubman, Bruce Tiemann, Long-Sheng Ma, Feng-Lei Hong, Olivier Pfister, Jun Ye, and John L. Hall

Conference on Lasers and Electro-Optics 1998

San Francisco, California United States
3–8 May 1998
ISBN: 1-55752-540-4

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Applications of Nonlinear Optics: II (CThT)

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M. Taubman, B. Tiemann, L. Ma, F. Hong, O. Pfister, J. Ye, and J. L. Hall, "Nonlinear optics to measure the frequency of iodine-stabilized Nd:YAG," in Conference on Lasers and Electro-Optics, D. Scifres and A. Weiner, eds., (Optica Publishing Group, 1998), paper CThT4.

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Abstract

We use the cycle-conserving accuracy of phase-matched nonlinear optics to make a precision measurement of the frequency of 532 nm of frequency-doubled Nd:YAG, stabilized to the a_l0 component in the R (56) 32-0 line of molecular iodine.

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