Techniques for high-speed scanning of free-space OCT devices

M. Bashkansky; M.D. Duncan; J. Reintjes

Conference on Lasers and Electro-Optics
(Optica Publishing Group, 1998),
paper CThO27

Techniques for high-speed scanning of free-space OCT devices

M. Bashkansky, M.D. Duncan, and J. Reintjes

Conference on Lasers and Electro-Optics 1998

San Francisco, California United States
3–8 May 1998
ISBN: 1-55752-540-4

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Poster Session: III (CThO)

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M. Bashkansky, M. D. Duncan, and J. Reintjes, "Techniques for high-speed scanning of free-space OCT devices," in Conference on Lasers and Electro-Optics, D. Scifres and A. Weiner, eds., (Optica Publishing Group, 1998), paper CThO27.

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Abstract

The nondestructive evaluation of critical metal, ceramic, semiconductor, and composite components is essential for many industrial and military applications.

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