Ultrafast scanning tunneling microscopy ysing a photoexcited low-temperature-growrt GaAs tip

G.P. Donati; D. Some; G. Rodriguez; A.J. Taylor

Conference on Lasers and Electro-Optics
(Optica Publishing Group, 1998),
paper CFJ5

Ultrafast scanning tunneling microscopy ysing a photoexcited low-temperature-growrt GaAs tip

G.P. Donati, D. Some, G. Rodriguez, and A.J. Taylor

Conference on Lasers and Electro-Optics 1998

San Francisco, California United States
3–8 May 1998
ISBN: 1-55752-540-4

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Ultrafast Measurement Techniques (CFJ)

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G. P. Donati, D. Some, G. Rodriguez, and A. J. Taylor, "Ultrafast scanning tunneling microscopy ysing a photoexcited low-temperature-growrt GaAs tip," in Conference on Lasers and Electro-Optics, D. Scifres and A. Weiner, eds., (Optica Publishing Group, 1998), paper CFJ5.

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Abstract

The invention of the scanning tunneling microscope (STM) revolutionized the field of surface science, enabling the first images of surface structure on an atomic length scale.

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