Abstract
There is a desire in manufacturing environments to nondestractively evaluate components and control processes in real time.
© 1998 Optical Society of America
PDF ArticleMore Like This
G. J. Dunning, D. M. Pepper, M, P. Chiao, P. V. Mitchell, and F. M. Davidson
CMK5 Conference on Lasers and Electro-Optics (CLEO:S&I) 1997
G.J. Dunning, M.P. Chiao, D.M. Pepper, and P.V. Mitchell
CFI7 Conference on Lasers and Electro-Optics (CLEO:S&I) 1998
Y. Ding, I. Lahiri, D.D. Nolte, G.J. Dunning, and D.M. Pepper
CFI5 Conference on Lasers and Electro-Optics (CLEO:S&I) 1998